MSE588
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MSE588 - Scanning Electron Microscopy
Course ID
023035
Course Description
Theoretical and practical aspects of electron-beam microanalysis. Lab emphasizes projects and independent research using scanning electron microscopy and energy dispersive X-ray analysis. Graduate-level requirements include additional lab work.
Min Units
3
Max Units
3
Repeatable for Credit
No
Grading Basis
GRD - Regular Grades A, B, C, D, E
Career
Graduate
Component
Lecture
Optional Component
No